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Automated Wafer Probing with Vertical Probe Cards on the SUMMIT200 Probe Station – FormFactor
FormFactor’s ReAlign™ technology for the SUMMIT200 wafer probe station enables automated probe-to-pad alignment for applications with limited microscope view such as vertical and Pyramid probe cards. Measurements can be performed automatically on small pads from -40°C to +125°C with FormFactor’s Pyramid and Takumi probe cards, Celadon ...
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